Interactive Analysis of Post-Silicon Validation Data

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Andrés Lalama, Johannes Knittel, Steffen Koch, Daniel Weiskopf, Thomas Ertl, Sarah Rottacker, Raphaël Latty, Jochen Rivoir

 View presentation:2022-10-17T14:55:00ZGMT-0600Change your timezone on the schedule page
2022-10-17T14:55:00Z

Exemplar figure, described by caption below — Overview visualization of a post-silicon validation dataset. Based on a chosen target error attribute (here: JTotal), validation engineers can define thresholds on the right side of the interface to divide test cases into passed, neutral, or failed

The live footage of the talk, including the Q&A, can be viewed on the session page, TestVis: Session 1.

Abstract